Low-temperature scanning laser microscopy has been used to investigate the spatial variation of the critical temperature Tc and critical current Ic in thin-film high-Tc multilayer structures that include dielectric layers. The method is described and measurements are presented on an YBa2Cu3O7-x-based multiturn coil with SrTiO3 insulating layer. We found that the critical temperature Tc of the YBa2Cu3O7-x top layer, from which the return strip of the coil is formed, is higher than that of the YBa2Cu3O7-x base layer. The critical current of the coil is limited by the quality of the YBa2Cu3O7-x base layer and not by the edges of the crossovers.
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